Effects of si slabs on the performance of cdO thin films designed for optoelectronic applications
dc.authorid | Atef Fayez Qasrawi / 0000-0001-8193-6975 | en_US |
dc.authorscopusid | Atef Fayez Qasrawi / 6603962677 | |
dc.authorwosid | Atef Fayez Qasrawi / R-4409-2019 | |
dc.contributor.author | AlGarnia, Sabah E. | |
dc.contributor.author | Qasrawi, Atef Fayez | |
dc.date.accessioned | 2022-05-18T11:50:55Z | |
dc.date.available | 2022-05-18T11:50:55Z | |
dc.date.issued | 2022 | en_US |
dc.department | İstinye Üniversitesi, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik-Elektronik Bölümü | en_US |
dc.description.abstract | Herein, the structural, morphological, optical and electrical properties of CdO stacked layers comprising Si slabs of thickness of 100 nm are investigated. The performance of the stacked layers, which are prepared by the thermal evaporation technique under vacuum pressure of 10-5 mbar, is remarkably enhanced via insertion of Si thin slabs. The presence of Si slabs between the layers of CdO improves the crystallinity and surface morphology, increases the light absorbability in the ultraviolet and visible ranges of light and also increases the dielectric constant, the quality factor, and optical conductivity values. The optical conductivity parameters, which are analyzed in accordance with Drude-Lorentz approach, have shown that the insertion of the Si layers rises the values of the drift mobility of holes in CdO and lowers the free holes concentration. The energy band gap of CdO films is narrowed from 2.20 to 1.27 eV upon insertion of Si slabs. The applicability of the plasmonic CdO/Si/CdO devices as low pass filers in | en_US |
dc.identifier.citation | AlGarnia, S. E., Qasrawi, A. F. (2022). Effects of si slabs on the performance of cdO thin films designed for optoelectronic applications. Materials Research, 25. | en_US |
dc.identifier.doi | 10.1590/1980-5373-MR-2021-0622 | en_US |
dc.identifier.issn | 1516-1439 | en_US |
dc.identifier.scopus | 2-s2.0-85131322397 | en_US |
dc.identifier.scopusquality | Q3 | en_US |
dc.identifier.uri | https://doi.org/10.1590/1980-5373-MR-2021-0622 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12713/2666 | |
dc.identifier.volume | 25 | en_US |
dc.identifier.wos | WOS:000802096200002 | en_US |
dc.identifier.wosquality | Q4 | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.institutionauthor | Qasrawi, Atef Fayez | |
dc.language.iso | en | en_US |
dc.publisher | SciELO | en_US |
dc.relation.ispartof | Materials Research | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | CdO/Si/CdO | en_US |
dc.subject | High Absorbance | en_US |
dc.subject | Optical Conductivity | en_US |
dc.subject | Microwave Cavity | en_US |
dc.title | Effects of si slabs on the performance of cdO thin films designed for optoelectronic applications | en_US |
dc.type | Article | en_US |
Dosyalar
Orijinal paket
1 - 1 / 1
Küçük Resim Yok
- Ä°sim:
- 249-2022-papers-13-CdO-Si-CdO (atef Sabah) MR.pdf
- Boyut:
- 1.5 MB
- Biçim:
- Adobe Portable Document Format
- Açıklama:
- Tam Metin / Full Text
Lisans paketi
1 - 1 / 1
Küçük Resim Yok
- Ä°sim:
- license.txt
- Boyut:
- 1.44 KB
- Biçim:
- Item-specific license agreed upon to submission
- Açıklama: