Characterization of PbWO4 thin films formed by the pulsed laser welding technique

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dc.authoridAtef Fayez Qasrawi / 0000-0001-8193-6975en_US
dc.authorscopusidAtef Fayez Qasrawi / 6603962677en_US
dc.authorwosidAtef Fayez Qasrawi / R-4409-2019en_US
dc.contributor.authorAlfhai, Latifa Hama Khalid
dc.contributor.authorQasrawi, Atef Fayez
dc.contributor.authorKhanfar, Hazem K.
dc.date.accessioned2023-05-29T13:35:58Z
dc.date.available2023-05-29T13:35:58Z
dc.date.issued2023en_US
dc.departmentİstinye Üniversitesi, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.description.abstractwithin couple of seconds in an argon atmosphere. Thin films of Pb (100 nm)/WO3 (500 nm) were deposited by the thermal evaporation technique under a vacuum pressure of 10?5 mbar. The films were then exposed to a pulse laser beam of fixed amplitude and variable pulse width (0.1–10 ms). The produced films were characterized by means of X-ray diffraction, scanning electron microscopy, energy dispersive X-ray spectroscopy and optical spectrophotometry techniques. An almost pure phase (~90%) of tetragonal PbWO4 was achieved after the pulse width exceeds 5.0 ms. PbWO4 thin films produced by the PLW technique exhibited a direct and indirect energy band gaps of 2.27 eV and 3.52 eV, respectively. Energy band tails of widths of 1.35 eV were found dominant in these films. In addition fitting of the dielectric resonance spectra for Pb/WO3 and PbWO4 thin films indicated that the formation of PbWO4 was accompanied with a decrease in the high frequency dielectric constant, a decrease in the free hole concentration and an increase in the electronic friction in the films. The fast method of obtaining PbWO4 thin films and the formation of the direct band gap being 2.27 eV together with the nonlinear dielectric and optical properties make the PbWO4 films obtained by the PLW technique suitable for optoelectronic technologyen_US
dc.identifier.citationAlfhaid, L. H. K., Qasrawi, A. F., & Khanfar, H. K. (2023). Characterization of PbWO4 thin films formed by the pulsed laser welding technique. Materials Today Communications, 106157.en_US
dc.identifier.doi10.1016/j.mtcomm.2023.106157en_US
dc.identifier.scopus2-s2.0-85159304715en_US
dc.identifier.startpage106157en_US
dc.identifier.urihttps://doi.org/10.1016/j.mtcomm.2023.106157
dc.identifier.urihttps://hdl.handle.net/20.500.12713/3925
dc.identifier.wosWOS:001042101500001en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorQasrawi, Atef Fayez
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofMaterials Today Communicationsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectPbWO4 Thin Filmsen_US
dc.subjectPulsed Laser Weldingen_US
dc.subjectInduced Crystallizationen_US
dc.subjectNonlinear Opticsen_US
dc.titleCharacterization of PbWO4 thin films formed by the pulsed laser welding techniqueen_US
dc.typeArticleen_US

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