Four-phases characterization of synthesised CeO2 thin films: Effect of molarity on structural, optical, physical properties and gamma-ray attenuation parameters

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dc.authoridHüseyin Ozan Tekin / 0000-0002-0997-3488en_US
dc.authorscopusidHüseyin Ozan Tekin / 56971130700en_US
dc.authorwosidHüseyin Ozan Tekin / J-9611-2016
dc.contributor.authorKurtaran, Sema
dc.contributor.authorKılıç, Gökhan
dc.contributor.authorIssa, Shams A.M.
dc.contributor.authorTekin, Hüseyin Ozan
dc.date.accessioned2022-06-07T08:24:33Z
dc.date.available2022-06-07T08:24:33Z
dc.date.issued2022en_US
dc.departmentİstinye Üniversitesi, Mühendislik ve Doğa Bilimleri Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.description.abstractA group of novel CeO2 thin films were synthesised using ultrasonic spray pyrolysis process. The composition ratios of these films were modified to investigate changes in their optical, surface, electrical, and structural characteristics. Absorbance spectra in the range 300–900 nm was acquired. Transmittance in the visible area was determined to be 50%. The optical band gap was reported to vary between 3.38 and 3.52eV using absorbance spectra. X-ray diffraction was used to analyse the films' structure, while atomic force microscopy was used to determine the surface roughness values. Spectroscopic ellipsometry and the Cauchy–Urbach model were used to calculate the thicknesses. Electrical resistivity values were determined using a four-probe system. CeO2 thin film X-ray diffraction patterns validated the polycrystalline cubic fluorite structure. According to the data, the deposited films expand preferentially in the (2 0 0) direction. The films were found to have a high resistivity of 106 ? cm. We also evaluated the nuclear radiation shielding properties of CeO2 thin films in the 0.015–15 MeV photon energy range. The results indicated that CeO2 thin film exhibits promising half value layers of 0.00169 cm, 0.14055 cm, 1.62665 cm, and 2.30273 cm, respectively, for 0.015 MeV, 0.15 MeV, 1 MeV, and 15 MeV CeO2 films have been determined to be worth working on and may be promising materials for optoelectronic and nuclear security applications. © 2022 Elsevier Ltd and Techna Group S.r.l.en_US
dc.identifier.citationKurtaran, S., Kilic, G., Issa, S. A. M., & Tekin, H. O. (2022). Four-phases characterization of synthesised CeO2 thin films: Effect of molarity on structural, optical, physical properties and gamma-ray attenuation parameters. Ceramics International, doi:10.1016/j.ceramint.2022.05.158en_US
dc.identifier.doi10.1016/j.ceramint.2022.05.158en_US
dc.identifier.issn0272-8842en_US
dc.identifier.scopus2-s2.0-85130522540en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2022.05.158
dc.identifier.urihttps://hdl.handle.net/20.500.12713/2829
dc.identifier.wosWOS:000841484000002en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorTekin, Hüseyin Ozan
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofCeramics Internationalen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCeO2 Thin Filmen_US
dc.subjectOptical Propertiesen_US
dc.subjectRadiation Attenuationen_US
dc.subjectRaman Spectraen_US
dc.subjectUltrasonic Spray Pyrolysisen_US
dc.subjectXRDen_US
dc.titleFour-phases characterization of synthesised CeO2 thin films: Effect of molarity on structural, optical, physical properties and gamma-ray attenuation parametersen_US
dc.typeArticleen_US

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